Agilent B1500A回收半导体分析仪
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b1500a semiconductor device analyzer
key features & specifications
general featurespc-based instrument with microsoft ® windows ® os and easyexpert softwaresingle-box solution for current-voltage (iv), capacitance-voltage (cv), pulse generation, fast iv, and time-domain measurement.ten module slots for source monitor units (smus) and other module types (mfcmu, hv-spgu and wgfmu)offline data analysis and application test development via desktop easyexpert softwaremeasurement capabilitiessupports current-voltage (iv) measurement to 0.1fa and 0.5µvsupports both quasi-static and medium-frequency capacitance-voltage (cv) measurementsupports accurate fast iv and time-domain measurement for a wide range of applications such as pulsed iv, nbti and rts noise (rtn) measurement.supports high voltage pulse generation (up to ±40 v) for high power and memory device testing.
description
summary
the agilent b1500a semiconductor device analyzer is a modular instrument with a ten-slot configuration that supports both iv and cv measurements and also fast high-voltage pulsing. its familiar, microsoft ® windows ® user interface supports agilent’s easyexpert software, which provides a new, more intuitive task-oriented approach to device characterization. because of its extremely low-current, low-voltage, and integrated capacitance measurement capabilities, the agilent b1500a can be used for a wide range of semiconductor device characterization needs (ic-cap supports the b1500a). it is also an excellent solution for non-volatile memory cell characterization and high-speed device characterization (including advanced nbti and rts noise (rtn) measurement). |
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