Xilinx FPGA Artix-7官方开发板赏析

只看该作者 · 2023-4-30 22:57

Xilinx FPGA主要分为两大类，一种侧重低成本应用，容量中等，性能可以满足一般的逻辑设计要求，如Spartan系列；还有一种侧重于高性能应用，容量大，性能能满足各类高端应用，如Virtex系列。Artix®-7 器件在 28nm 节点实现最低功耗和成本，并且经过优化的设计在低成本 FPGA 中实现最佳性能/功耗组合、AMS 集成、以及收发器线速。此系列为各类成本功耗敏感型应用提供最大价值，包括软件定义无线电、机器视觉照相以及低端无线回传。
(1) Artix-7 FPGA系列——业界最低功耗和最低成本
Artix®-7 器件在 28nm 节点实现最低功耗和成本，并且经过优化设计在低成本 FPGA 中实现最佳性能/功耗组合、AMS 集成、以及收发器线速。此系列为各类成本功耗敏感型应用提供最大价值，包括软件定义无线电、机器视觉照相以及低端无线回传。Xilinx® Artix® -7 系列 FPGA 重新定义了成本敏感型解决方案，功耗比上一代产品降低了一半，同时为高带宽应用提供一流的收发器和信号处理能力。这些设备基于 28 纳米 HPL 工艺构建，提供一流的性能功耗比。与 MicroBlaze™ 软处理器一起，Artix-7 FPGA 非常适用于便携式医疗设备、军用无线电和小型无线基础设施等产品。 Artix7 FPGA 满足对尺寸、重量、功率和成本 (SWaP-C) 敏感的市场，如消费类电子和通信等市场。
(2)Kintex-7 FPGA 系列——业界最佳性价比
（3）3)Virtex-7 FPGA 系列——业界最高系统性能和容量
开发板：

下载ＵＳＢ转串口驱动 CP2104 USB-to-UART driver.选择115200 baud, 8 bits, no parity, 1 stop bit可进**测试。

********************************************************

********************************************************

Choose Feature to Test:
1: IIC Test
2: DDR3 Memory Test
3: LED Test
4: DIP Switch Test
5: Push Button Test
A: Run all tests
0: Exit
1

1 1: IIC Test
~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~

~~    Artix-7 50T - IIC EEPROM Write/Read Tests    ~~

~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
The IIC test has already been run and will fail if run a second time.
You must power cycle the board or reconfigure the FPGA
before running this test again.

Press any key to return to main menu

2 DDR3 Memory Test

~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~

~~    Artix-7 50T - DDR3 Memory Tests             ~~

~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
! NOTE: This application runs with D-Cache disabled. !
! Cacheline requests will not be generated. !

This tests a 32MB chunk of DDR3 Memory.

Testing memory region: mig_7series_0

Memory Controller: mig_7series

      Base Address: 0x88000000

               Size: 0x08000000 bytes

      32-bit test: [32mPASSED[0m

      16-bit test: [32mPASSED[0m

         8-bit test: [32mPASSED[0m

*** Memory Tests Exit ***
红色小灯会亮起

3: LED Test
Press any key to return to main menu

4: DIP Switch Test
This test detects if the DIP switches have changed state on|off

First DIP switch read data:[5m0xFF[0m

Toggle any of the SW6 or SW7 DIP switches and press any key to continue.
SW6 and SW7 are located in the right hand side of the board
next to J9 and J10.

Second DIP switch read data:[5m0x1F[0m

*** DIP Switch Read Test: [32mPASSED[0m ***
*** DIP Switch Read Test Exit ***

Press any key to return to main menu

5: Push Button Test
This test detects SW[1:4] to determine if the correct
push button switch has been pressed.

SW[1:4] are located near the blue DONE LED.

Detect if any push buttons are currently pressed.
No push button presses detected.

Press down on push button SW1.

Press down on push button SW2.

Press down on push button SW3.

Press down on push button SW4.
*** Push Button Switch Read Test: [32mPASSED[0m ***
*** Push Button Switch Read Test Exit ***

Press any key to return to main menu

~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~

~~    Artix-7 50T - IIC EEPROM Write/Read Tests    ~~

~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
The IIC test has already been run and will fail if run a second time.
You must power cycle the board or reconfigure the FPGA
before running this test again.
The IIC test will be skipped.

~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~

~~    Artix-7 50T - DDR3 Memory Tests             ~~

~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
! NOTE: This application runs with D-Cache disabled. !
! Cacheline requests will not be generated. !

This tests a 32MB chunk of DDR3 Memory.

Testing memory region: mig_7series_0

Memory Controller: mig_7series

      Base Address: 0x88000000

               Size: 0x08000000 bytes

      32-bit test: [32mPASSED[0m

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