The "usage model" of ARMv8 SVE contiguous "non-fault"

Hello,
What exactly is the \"usage model\" of ARMv8 SVE contiguous \"non-fault\" load instructions ?
I understand the usage model of \"first-fault\" SVE instrcutions (which is described in many white papers) but the \"usage model\" of ARMv8 SVE contiguous \"non-fault\" load instructions is not clear to me.
What I am looking for is the example of why this instruction is useful (i.e. why it has been introduced in the SVE instruction set).
For instance, for the \"first-fault\" load SVE instructions the usage model is the implementation of the loops with the \"dynamic\" exit criteria detection (as it is explained in the multiple ARM white papers on SVE)
I am looking for the similar explanation and/or example of the \"usage model\" for the SVE \"non-fault\" load instructions