请教一下大家，我使用XDS100V2对合众达的DEC5502板子调试，但是现在死活连接不上板子，请大家帮忙分析一下问题出在哪里。首先是驱动已经安装好了，如图：
然后建立CCXML配置文件，选择XDS100V2和TMS320VC5502芯片后，点击test connection后，提示出现fail，如下：
[Start]
Execute the command:
%CCS_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
-----[Print the board config pathname(s)]------------------------------------
C:\Users\YuAnNing\AppData\Local\.TI\1212777678\
0\0\BrdDat\testBoard.dat
-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'May 30 2012'.
The library build time was '22:52:27'.
The library package version is '5.0.747.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
-----[Print the reset-command hardware log-file]-----------------------------
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
-----[The log-file for the JTAG TCLK output generated from the PLL]----------
There is no hardware for programming the JTAG TCLK frequency.
-----[Measure the source and frequency of the final JTAG TCLKR input]--------
There is no hardware for measuring the JTAG TCLK frequency.
-----[Perform the standard path-length test on the JTAG IR and DR]-----------
This path-length test uses blocks of 512 32-bit words.
The test for the JTAG IR instruction path-length succeeded.
The JTAG IR instruction path-length is 38 bits.
The test for the JTAG DR bypass path-length succeeded.
The JTAG DR bypass path-length is 1 bits.
-----[Perform the Integrity scan-test on the JTAG IR]------------------------
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 7: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 8: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 9: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 10: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 11: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 12: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 13: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 3, skipped: 0, failed: 1
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 2
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 3
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 4
Some of the values were corrupted - 66.3 percent.
The JTAG IR Integrity scan-test has failed.
-----[Perform the Integrity scan-test on the JTAG DR]------------------------
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Test 3 Word 17: scanned out 0xFE03E0E2 and scanned in 0xFFFFE0E2.
Test 3 Word 18: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 19: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 20: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 21: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 22: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 23: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 24: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 3, skipped: 0, failed: 1
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 2
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 3
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 4
Some of the values were corrupted - 65.9 percent.
The JTAG DR Integrity scan-test has failed.
[End]
如果点击此时点击debug的话，会报错，如图：
我这个程序在CCS3.3下用XDS510调试器可以成功仿真的，然后把工程导入CCS5后，就是这种问题了。现在我就是不太清楚到底是驱动出现了问题，还是调试器的硬件出现问题，哪位有经验的可以指点一下，毕竟我也是新学，有好多东西不了解。谢谢大家。 |
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