A simple algorithm which unifies the
calibration procedures for Scattering and Load Pull
measurements is proposed. The new technique is
particulary useful when measuring non-insertable
devices and for on-wafer characterizations. The
algorithm was compared with other well
established calibration techniques with very good
results in terms of accuracy.
RF0907002--A Unified Calibration Algorithm for Scattering and Load-Pull Measurement.pdf
(3.77 MB)
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